Monday 11 April 2011

Benchtop CNC

PANalytical introduced a new range of Epsilon 3 benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometers. Able to deliver accurate, precise, and reliable results across the periodic table, Epsilon 3 and Epsilon 3 XL versions match the analytical performance of larger, more powerful spectrometers, according to the company.

Light-element performance, full data traceability, and a variety of software options for standardless analysis, rapid identification fingerprinting, or regulatory compliance, characterize the range.

Epsilon 3 features a new high-performance ceramic tube that has been developed specifically for this system. In addition, the range utilizes the latest in silicon drift detector technology. Thin windows on both X-ray tube and detector enable light-element analysis down to fluorine. Sample preparation is straightforward and a variety of sample types can be measured including solids, pressed and loose powders, liquids, and filter samples weighing from a few grams to larger bulk samples.
SOURCE :  http://www.cnccncmachines.com

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